{"id":14833,"date":"2021-01-20T00:00:00","date_gmt":"2021-01-19T23:00:00","guid":{"rendered":"https:\/\/www.sylex.sk\/mmf-alebo-bimmf-alias-starsie-vlakno-vs-vlakno-necitlive-na-ohyb-v-hlavnych-prepojkach\/"},"modified":"2024-06-05T17:57:36","modified_gmt":"2024-06-05T16:57:36","slug":"mmf-alebo-bimmf-alias-starsie-vlakno-vs-vlakno-necitlive-na-ohyb-v-hlavnych-prepojkach","status":"publish","type":"post","link":"https:\/\/www.sylex.sk\/sk\/mmf-alebo-bimmf-alias-starsie-vlakno-vs-vlakno-necitlive-na-ohyb-v-hlavnych-prepojkach\/","title":{"rendered":"MMF alebo BIMMF alias star\u0161ie vl\u00e1kno vs. vl\u00e1kno necitliv\u00e9 na ohyb v hlavn\u00fdch prepojk\u00e1ch"},"content":{"rendered":"\t\t
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S rozvojom technol\u00f3gi\u00ed niektor\u00e9 vyn\u00e1lezy nahr\u00e1dzaj\u00fa in\u00e9 a nahraden\u00e9 vyn\u00e1lezy sa st\u00e1vaj\u00fa star\u0161\u00edmi produktmi. To plat\u00ed aj pre optick\u00e9 vl\u00e1kna. V s\u00fa\u010dasnosti \u010doraz viac spolo\u010dnost\u00ed pou\u017e\u00edva BIMMF (ohybovo necitliv\u00e9 multim\u00f3dov\u00e9 vl\u00e1kno) a je \u010doraz \u0165a\u017e\u0161ie k\u00fapi\u0165 be\u017en\u00e9 MMF (multim\u00f3dov\u00e9 vl\u00e1kno), preto\u017ee ide o star\u0161\u00ed produkt. Na tom by nemalo z\u00e1le\u017ea\u0165, ale z\u00e1le\u017e\u00ed.
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Pod\u013ea novej rev\u00edzie normy IEC 61280-4-1: „Pri vykon\u00e1van\u00ed sk\u00fa\u0161ok LSPM optick\u00fdch vl\u00e1kien A1-OMxa alebo A1-OMxb m\u00f4\u017ee odpa\u013eovacia \u0161n\u00fara obsahova\u0165 optick\u00e9 vl\u00e1kna pododdelenia A1-OMXa alebo A1-OMxb (BIMMF).“ To znamen\u00e1, \u017ee nez\u00e1le\u017e\u00ed na tom, \u010di v DUT (testovanom zariaden\u00ed) pou\u017e\u00edvate MMF alebo BIMMF. Nie je ani d\u00f4le\u017eit\u00e9, \u010di hlavn\u00fd most\u00edk pou\u017eit\u00fd na vyhodnotenie DUT m\u00e1 MMF alebo BIMMF. Jedin\u00e9, na \u010dom z\u00e1le\u017e\u00ed, je, aby DUT aj hlavn\u00fd most\u00edk mali rovnak\u00fa ve\u013ekos\u0165 jadra. Ale nie je v tom rozdiel? Nemus\u00ed sa bra\u0165 do \u00favahy, \u010di m\u00e1 hlavn\u00fd most\u00edk MMF alebo BIMMF? Ako v\u00fdrobn\u00e1 spolo\u010dnos\u0165, ktor\u00e1 po\u010das svojej existencie ukon\u010dila viac ako 20 mili\u00f3nov konektorov a m\u00e1 z\u00e1kazn\u00edkov po celom svete, vieme, \u017ee ka\u017ed\u00fd typ vl\u00e1kna a ka\u017ed\u00fd konektor m\u00e1 svoje vlastn\u00e9 vlastnosti a spr\u00e1vanie. Preto sme sa rozhodli pozrie\u0165 sa na t\u00fato problematiku bli\u017e\u0161ie a na vlastn\u00e9 o\u010di zisti\u0165, \u010di je potrebn\u00e9 venova\u0165 pozornos\u0165 typu vl\u00e1kna v DUT a v hlavnom most\u00edku. Pripravili sme nieko\u013eko testov, aby sme pochopili rozdiel medzi k\u00e1blami MMF a BIMMF. Na kontrolu kvality ukon\u010den\u00e9ho konektora sa be\u017ene pou\u017e\u00edva nieko\u013eko met\u00f3d:<\/span><\/p>\n

– <\/span>Vizu\u00e1lna kontrola
<\/span>– <\/span>Geometria
<\/span>– <\/span>meranie IL<\/span><\/p>\n

V\u0161etky konektory pou\u017eit\u00e9 v testoch pre\u0161li hodnoten\u00edm geometrie pod\u013ea normy Telcordia GR326 pre jednovl\u00e1knov\u00e9 konektory a normy IEC 63267-3-31 pre viacvl\u00e1knov\u00e9 konektory, preto sme sa rozhodli pozrie\u0165 na MMF a BIMMF prostredn\u00edctvom vizu\u00e1lnej kontroly a merania IL.<\/span><\/p>\n

Vizu\u00e1lna kontrola<\/span> <\/strong><\/p>\n

Kontrolovan\u00fd v\u00fdrobok:
– <\/span>LC\/PC – SC\/APC 50\/125\u00b5m MMF simplexn\u00fd prepoj 3,0m
<\/span>– <\/span>LC\/PC – SC\/APC 50\/125\u00b5m BIMMF simplexn\u00fd prepoj 3,0m<\/span><\/p>\n

Met\u00f3da kontroly:
– <\/span>Kontrola pod\u013ea IEC-61300-3-35<\/span><\/p>\n

Pou\u017eit\u00e9 vybavenie:
– <\/span>Mikroskop VIAVI FVD-2400<\/span><\/p>\n

\"\"<\/strong><\/p>\n

Jedn\u00fdm z najjednoduch\u0161\u00edch sp\u00f4sobov, ako zisti\u0165 rozdiel medzi t\u00fdmito dvoma typmi vl\u00e1kien, je vizu\u00e1lna kontrola. Tenk\u00fd kr\u00fa\u017eok na BIMMF ozna\u010duje priekopu, vrstvu okolo jadra vl\u00e1kna, ktor\u00e1 m\u00e1 ni\u017e\u0161\u00ed index lomu ako jadro. V\u010faka tomu sa vy\u0161\u0161ie m\u00f3dy pri oh\u00fdban\u00ed vl\u00e1kna odr\u00e1\u017eaj\u00fa sp\u00e4\u0165 do jeho jadra. Vzh\u013eadom na to, \u017ee ide o meranie vlo\u017en\u00fdch str\u00e1t (IL), rozdiel medzi vl\u00e1knami MMF a BIMMF spo\u010d\u00edva v netesn\u00fdch vy\u0161\u0161\u00edch m\u00f3doch, ktor\u00e9 s\u00fa pr\u00edtomn\u00e9 vo vl\u00e1kne BIMMF. Referencia vykonan\u00e1 pred meran\u00edm DUT vyrovn\u00e1 v\u0161etky rozdiely medzi typmi vl\u00e1kien BIMMF a MMF pou\u017eit\u00fdch v hlavn\u00fdch prepojk\u00e1ch, ale toto vyrovnanie sa m\u00f4\u017ee \u013eahko naru\u0161i\u0165 pri manipul\u00e1cii s hlavnou prepojkou a DUT po\u010das merania.
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Meranie vlo\u017en\u00e9ho \u00fatlmu<\/span><\/strong><\/p>\n

S\u00fabor testov:
– <\/span>LC\/PC pred\u010dasn\u00e9 meranie pod\u013ea met\u00f3dy B IEC-61300-3-4 pomocou hlavn\u00fdch most\u00edkov MMF a BIMMF
<\/span>– <\/span>MTP kme\u0148 meran\u00fd pod\u013ea IEC-61300-3-4 met\u00f3dou B pomocou hlavn\u00fdch most\u00edkov MMF a BIMMF
<\/span>– <\/span>LC\/PC to MTP fanout meran\u00fd pod\u013ea IEC 61280-4-1 pr\u00edloha A, referen\u010dn\u00e1 met\u00f3da jedn\u00e9ho k\u00e1bla pomocou MMF a BIMMF master jumperov. <\/span> <\/p>\n

Pred\u010dasn\u00e9 ukon\u010denie LC\/PC meran\u00e9 hlavn\u00fdmi prepojkami MMF a BIMMF<\/span><\/strong><\/p>\n

Testovan\u00fd v\u00fdrobok:
– <\/span>48xLC\/PC – 48xLC\/PC 48F 50\/125\u00b5m BIMMF preterm 13,0m
<\/span>– <\/span>72xLC\/PC – 72xLC\/PC 72F 50\/125\u00b5m BIMMF preterm 185,0m<\/span><\/p>\n

Hlavn\u00fd most\u00edk:
– <\/span>LC\/PC – SC\/APC 50\/125\u00b5m MMF simplexn\u00fd prepoj 3,0m
<\/span>– <\/span>LC\/PC – SC\/APC 50\/125\u00b5m BIMMF simplexn\u00fd most\u00edk 3,0m<\/span><\/p>\n

Met\u00f3da merania:
– <\/span>Meranie pod\u013ea IEC-61300-3-4 met\u00f3da B<\/span><\/p>\n

Pou\u017eit\u00e9 vybavenie:
– <\/span>Syst\u00e9m JGR MS12001<\/span><\/p>\n

\"\"<\/strong><\/p>\n

Vizu\u00e1lna kontrola jadier vl\u00e1kien v MMF a BIMMF ukazuje, \u017ee medzi t\u00fdmito jadrami je rozdiel. Okolo jadra BIMMF sa nach\u00e1dza \u010fal\u0161ia vrstva obklopuj\u00faca jadro. T\u00e1to vrstva zabra\u0148uje \u00faniku svetla pri oh\u00fdban\u00ed. Na tento test bol zvolen\u00fd konektor LC ako jeden z najbe\u017enej\u0161\u00edch typov konektorov. Konektor LC bol ukon\u010den\u00fd na 50\/125\u00b5m BIMMF. V hlavn\u00fdch prepojk\u00e1ch, ktor\u00e9 sa pou\u017eili na tento test, sa pou\u017eili dva r\u00f4zne typy vl\u00e1kien. Jedna skupina hlavn\u00fdch most\u00edkov bola s 50\/125\u00b5m MMF, aby reprezentovala star\u0161ie v\u00fdrobky, a druh\u00e1 skupina bola s 50\/125\u00b5m BIMMF, aby reprezentovala vl\u00e1kna be\u017ene pou\u017e\u00edvan\u00e9 v s\u00fa\u010dasnosti. Po\u010diato\u010dn\u00e9 podmienky zostali pri v\u0161etk\u00fdch testoch rovnak\u00e9. To znamen\u00e1, \u017ee meracie zariadenie, v\u0161etky adapt\u00e9ry pou\u017eit\u00e9 na pripojenie DUT a hlavn\u00e9ho most\u00edka spolu s merac\u00edm zariaden\u00edm a v\u0161etky ostatn\u00e9 faktory, ktor\u00e9 by mohli ovplyvni\u0165 v\u00fdsledok testu, zostali nezmenen\u00e9. S ka\u017ed\u00fdm hlavn\u00fdm most\u00edkom sa otestovalo takmer 250 konektorov. Priemern\u00e9 hodnoty v\u0161etk\u00fdch meran\u00ed z\u00edskan\u00fdch pomocou MMF a BIMMF s\u00fa uveden\u00e9 v tabu\u013eke 1. Pod\u013ea toho sa najlep\u0161ie v\u00fdsledky dosiahli pomocou hlavn\u00fdch most\u00edkov s 50\/125 \u00b5m MMF. Hodnoty z\u00edskan\u00e9 pomocou BIMMF s\u00fa o 138 % vy\u0161\u0161ie ako hodnoty z\u00edskan\u00e9 pomocou MMF. Podrobnej\u0161ie v\u00fdsledky s\u00fa uveden\u00e9 v grafe 1, kde je vidie\u0165, \u017ee hoci rozptyl hodn\u00f4t IL z\u00edskan\u00fdch pomocou MMF a BIMMF je porovnate\u013en\u00fd, v\u0161etky v\u00fdsledky z\u00edskan\u00e9 pomocou BIMMF s\u00fa vy\u0161\u0161ie ako v\u00fdsledky z\u00edskan\u00e9 pomocou hlavn\u00fdch most\u00edkov MMF.
<\/span><\/p>\n

\"\"<\/strong><\/p>\n

\"\"<\/p>\n

Kme\u0148 MTP meran\u00fd hlavn\u00fdmi prepojkami MMF a BIMMF<\/span><\/strong><\/p>\n

Testovan\u00fd v\u00fdrobok:
– <\/span>1xMTP(F) – 1xMTP(F) 12F 50\/125\u00b5m BIMMF kme\u0148 Pol. B 20,0 m
<\/span>– <\/span>1xMTP(F) – 1xMTP(F) 12F 50\/125\u00b5m BIMMF kme\u0148 Pol. B 29,0 m
<\/span>– <\/span>1xMTP(F) – 1xMTP(F) 12F 50\/125\u00b5m BIMMF kme\u0148 Pol. B 32,0 m<\/span><\/p>\n

Hlavn\u00fd most\u00edk:
– <\/span>1xMTP(M) – 1xMTP(M) 12F 50\/125\u00b5m MMF kme\u0148 3,0m
<\/span>– <\/span>1xMTP(M) – 1xMTP(M) 12F 50\/125\u00b5m BIMMF kme\u0148 3,0m<\/span><\/p>\n

Met\u00f3da merania:
– <\/span>Meranie pod\u013ea IEC-61300-3-4 met\u00f3da B<\/span><\/p>\n

Pou\u017eit\u00e9 vybavenie:
– <\/span>Syst\u00e9m JGR MS12001<\/span><\/p>\n

\"\"<\/strong><\/p>\n

Pre tento test bol vybran\u00fd konektor MTP, ktor\u00fd je jedn\u00fdm z naj\u017eiadanej\u0161\u00edch konektorov v d\u00e1tov\u00fdch centr\u00e1ch. Konektor MTP bol ukon\u010den\u00fd na 50\/125\u00b5m BIMMF. V hlavn\u00fdch prepojk\u00e1ch, ktor\u00e9 sa pou\u017eili na tento test, sa pou\u017eili dva r\u00f4zne typy vl\u00e1kien. Jedna skupina hlavn\u00fdch most\u00edkov obsahovala 50\/125 \u00b5m MMF, zatia\u013e \u010do druh\u00e1 skupina obsahovala 50\/125 \u00b5m BIMMF. Po\u010diato\u010dn\u00e9 podmienky zostali pri v\u0161etk\u00fdch testoch rovnak\u00e9. Pri ka\u017edom hlavnom most\u00edku sa z\u00edskalo takmer 200 hodn\u00f4t. Najlep\u0161ie v\u00fdsledky sa dosiahli pri pou\u017eit\u00ed hlavn\u00fdch most\u00edkov s MMF 50\/125 \u00b5m, ako je vidie\u0165 v tabu\u013eke 2. Hodnoty z\u00edskan\u00e9 pomocou BIMMF s\u00fa o 11 % vy\u0161\u0161ie ako hodnoty z\u00edskan\u00e9 pomocou MMF. Podrobn\u00e9 v\u00fdsledky s\u00fa uveden\u00e9 v grafe 2. Rozptyl v\u00fdsledkov z\u00edskan\u00fdch pomocou MMF a BIMMF je navz\u00e1jom porovnate\u013en\u00fd. Vlo\u017en\u00e9 straty nameran\u00e9 pomocou hlavn\u00fdch most\u00edkov BIMMF boli vy\u0161\u0161ie ako straty z\u00edskan\u00e9 pomocou MMF.
<\/span><\/p>\n

\"\"<\/strong>\"\"<\/strong><\/p>\n

LC\/PC to MTP fanout meran\u00fd pomocou MMF a BIMMF master jumperov<\/span><\/strong><\/p>\n

Testovan\u00fd v\u00fdrobok:
– <\/span>6xLCD\/PC – 1xMTP(F) 12F 50\/125\u00b5m BIMMF direct split 0,34m<\/span><\/p>\n

Hlavn\u00fd most\u00edk:
– <\/span>1xMTP(M) – 1xMTP(M) 12F 50\/125\u00b5m BIMMF kme\u0148 3,0m
<\/span>– <\/span>LC\/PC – SC\/APC 50\/125\u00b5m MMF simplexn\u00fd prepoj 3,0m
<\/span>– <\/span>LC\/PC – SC\/APC 50\/125\u00b5m BIMMF simplexn\u00fd prepoj 3,0m<\/span><\/p>\n

Met\u00f3da merania:
– <\/span>Meranie pod\u013ea IEC 61280-4-1 pr\u00edloha A, referen\u010dn\u00e1 met\u00f3da s jedn\u00fdm k\u00e1blom<\/span><\/p>\n

Pou\u017eit\u00e9 vybavenie:
– <\/span>Syst\u00e9m JGR MS12001<\/span><\/p>\n

\"\"<\/strong><\/p>\n

Na tento test bola zvolen\u00e1 kombin\u00e1cia konektorov LC a MTP. Konektory LC a MTP boli ukon\u010den\u00e9 na 50\/125\u00b5m BIMMF. Ke\u010f\u017ee sa v tomto teste merala hodnota kan\u00e1la, po\u010das merania sa pou\u017eili dva hlavn\u00e9 prepojky. Pred meran\u00edm bol referencovan\u00fd prv\u00fd hlavn\u00fd most\u00edk obsahuj\u00faci jedno vl\u00e1kno. Druh\u00fd hlavn\u00fd most\u00edk obsahuj\u00faci viacero vl\u00e1kien nebol referencovan\u00fd. Po\u010das merania bol prv\u00fd hlavn\u00fd most\u00edk pripojen\u00fd pred DUT a druh\u00fd hlavn\u00fd most\u00edk bol pripojen\u00fd za DUT. V jednovl\u00e1knov\u00fdch hlavn\u00fdch most\u00edkoch, ktor\u00e9 sa pou\u017eili na tento test, sa pou\u017eili dva r\u00f4zne typy vl\u00e1kien (50\/125 \u00b5m MMF a 50\/125 \u00b5m BIMMF), ale vo viacvl\u00e1knov\u00fdch hlavn\u00fdch most\u00edkoch sa pou\u017eili len vl\u00e1kna 50\/125 \u00b5m BIMMF. T\u00fdm sa zmenila len jedna podmienka pri prechode z 50\/125 \u00b5m MMF na 50\/125 \u00b5m BIMMF. Po\u010diato\u010dn\u00e9 podmienky zostali pri v\u0161etk\u00fdch testoch rovnak\u00e9. T\u00e1to sk\u00fa\u0161ka sa vykonala pod\u013ea IEC 61280-4-1, pr\u00edloha A, referen\u010dn\u00e1 met\u00f3da s jedn\u00fdm k\u00e1blom. Ka\u017ed\u00fd hlavn\u00fd most\u00edk nameral pribli\u017ene 270 hodn\u00f4t. Najlep\u0161ie v\u00fdsledky sa v priemere dosiahli pri hlavn\u00fdch prepojk\u00e1ch s 50\/125 \u00b5m MMF. Hodnoty z\u00edskan\u00e9 pomocou BIMMF s\u00fa o 118 % vy\u0161\u0161ie ako hodnoty z\u00edskan\u00e9 pomocou MMF. Podrobnej\u0161ie v\u00fdsledky s\u00fa uveden\u00e9 v grafe 3, kde je vidie\u0165, \u017ee v hodnot\u00e1ch vlo\u017en\u00fdch str\u00e1t z\u00edskan\u00fdch pomocou BIMMF bol mierne vy\u0161\u0161\u00ed rozptyl. V\u0161etky v\u00fdsledky z\u00edskan\u00e9 pomocou BIMMF s\u00fa vy\u0161\u0161ie ako v\u00fdsledky z\u00edskan\u00e9 pomocou hlavn\u00fdch most\u00edkov MMF.
<\/span><\/p>\n

\"\"<\/strong><\/p>\n

\"\"<\/strong><\/p>\n

Z\u00e1ver<\/span><\/strong><\/p>\n

Hoci norma IEC 61280-4-1 umo\u017e\u0148uje pou\u017eitie MMF a BIMMF v hlavn\u00fdch prepojk\u00e1ch a ich vz\u00e1jomn\u00fa v\u00fdmenu, na prv\u00fd poh\u013ead je zrejm\u00e9, \u017ee ide o r\u00f4zne vl\u00e1kna. BIMMF m\u00e1 okolo jadra e\u0161te jednu vrstvu navy\u0161e. Z h\u013eadiska geometrie nem\u00e1 t\u00e1to vrstva \u017eiadny vplyv, ale pod\u013ea v\u00fdsledkov merania IL existuje rozdiel medzi nameran\u00fdmi hodnotami z\u00edskan\u00fdmi s hlavn\u00fdm most\u00edkom s MMF a s hlavn\u00fdm most\u00edkom s BIMMF. Testy uk\u00e1zali, \u017ee ak DUT obsahuje BIMMF, pou\u017eitie rovnak\u00e9ho typu vl\u00e1kna v hlavnom most\u00edku poskytne vy\u0161\u0161ie vlo\u017en\u00e9 straty ako hlavn\u00fd most\u00edk so star\u0161\u00edm MMF, ktor\u00fd sa v minulosti odpor\u00fa\u010dal v norme IEC. Tieto testy uk\u00e1zali, \u017ee tento rozdiel m\u00f4\u017ee by\u0165 a\u017e 0,19 dB. Hoci nov\u00e1 rev\u00edzia normy IEC umo\u017e\u0148uje pou\u017eitie MMF alebo BIMMF v hlavn\u00fdch prepojk\u00e1ch, je potrebn\u00e9 vzia\u0165 do \u00favahy, \u017ee tieto vl\u00e1kna maj\u00fa r\u00f4zne vlastnosti a spr\u00e1vaj\u00fa sa odli\u0161ne.<\/span><\/p>\n

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Juraj Kadlec – <\/span>In\u017einier metrol\u00f3gie<\/span> <\/strong> – Kontakt<\/a><\/p>\n

Juraj Kadlec je metrologick\u00fd in\u017einier v spolo\u010dnosti Sylex. Za\u010d\u00ednal ako projektov\u00fd in\u017einier so \u0161pecializ\u00e1ciou na viacvl\u00e1knov\u00fa technol\u00f3giu MTP. Svoje aktivity roz\u0161\u00edril na senzory optick\u00fdch vl\u00e1kien. Nesk\u00f4r sa podie\u013eal na technologick\u00fdch a in\u017einierskych \u010dinnostiach zodpovedn\u00fdch za prenos n\u00e1padov z\u00e1kazn\u00edkov do fin\u00e1lnych produktov. Nesk\u00f4r zast\u00e1val funkciu priemyseln\u00e9ho in\u017einiera a bol zodpovedn\u00fd za dokument\u00e1ciu v\u00fdrobkov. Na svojej s\u00fa\u010dasnej poz\u00edcii je zodpovedn\u00fd za metrol\u00f3giu, anal\u00fdzu nameran\u00fdch \u00fadajov, optimaliz\u00e1ciu v\u0161etk\u00fdch pr\u00edstrojov pou\u017e\u00edvan\u00fdch na meranie, ich \u00fadr\u017ebu a servis.<\/span><\/p>\n\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

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\n\t\t\t\t\t\t\t\t\t

One of the easiest ways to spot the difference between these two types of fibres is visual inspection. The thin circle on BIMMF indicates the trench, a layer around the fibre core that has a lower refractive index than the core. Thanks to this, the higher modes are reflected back to the fibre core when the fibre is bent. Taking this into account in terms of measuring insertion loss (IL), a difference between MMF and BIMMF fibres are the leaky higher modes that are present in BIMMF fibre. The reference done before measurement of the DUT will equalise any differences between BIMMF and MMF fibre types used in master jumpers, but this equalisation can be easily disturbed when manipulating the master jumper and the DUT during measurement.
<\/span><\/p>\n

Measurement of insertion loss<\/span><\/strong><\/p>\n

Set of tests:
\u2022 <\/span>LC\/PC preterm measured according to IEC-61300-3-4 method B by MMF and BIMMF master jumpers
<\/span>\u2022 <\/span>MTP trunk measured according to IEC-61300-3-4 method B by MMF and BIMMF master jumpers
<\/span>\u2022 <\/span>LC\/PC to MTP fanout measured according to IEC 61280-4-1 annex A, one cord reference method by MMF and BIMMF master jumpers. <\/span><\/p>\n

LC\/PC preterm measured by MMF and BIMMF master jumpers<\/span><\/strong><\/p>\n

Tested product:
\u2022 <\/span>48xLC\/PC \u2013 48xLC\/PC 48F 50\/125\u00b5m BIMMF preterm 13.0m
<\/span>\u2022 <\/span>72xLC\/PC \u2013 72xLC\/PC 72F 50\/125\u00b5m BIMMF preterm 185.0m<\/span><\/p>\n

Master jumper:
\u2022 <\/span>LC\/PC \u2013 SC\/APC 50\/125\u00b5m MMF simplex jumper 3.0m
<\/span>\u2022 <\/span>LC\/PC \u2013 SC\/APC 50\/125\u00b5m BIMMF simplex jumper 3.0m<\/span><\/p>\n

Measurement method:
\u2022 <\/span>Measured according to IEC-61300-3-4 method B<\/span><\/p>\n

Equipment used:
\u2022 <\/span>JGR MS12001 system<\/span><\/p>\n\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

\n\t\t\t\t
\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\"\"\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
\n\t\t\t\t
\n\t\t\t\t\t\t\t\t\t

A visual inspection of the fibre cores in MMF and BIMMF shows that there is a difference between these cores. Around the BIMMF core is an extra layer surrounding the core. This layer prevents the light from escaping while bent. For this test an LC connector was chosen as one of the most common connector types. The LC connector was terminated on 50\/125\u00b5m BIMMF. Two different fibre types were used in the master jumpers that were used for this test. One group of master jumpers was with 50\/125\u00b5m MMF to represent legacy products and the other group was with 50\/125\u00b5m BIMMF to represent fibres commonly used nowadays. The initial conditions stayed the same for all tests. That means that the measuring device, all adapters used to connect the DUT and master jumper together with the measuring device and all other factors that could affect the outcome of the test stayed unchanged. Almost 250 connectors were tested with each master jumper. The average value of all measurements obtained by MMF and BIMMF are shown in table 1. According to this, the best results were obtained by master jumpers with 50\/125\u00b5m MMF. Values obtained by BIMMF are 138% higher than the value obtained by MMF. More detailed results are shown in chart 1, where it can be seen that although the dispersion of IL values obtained by MMF and BIMMF are comparable, all results obtained by BIMMF are higher than the ones obtained by MMF master jumpers.<\/span><\/p>\n\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

\n\t\t\t\t
\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\"\"\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
\n\t\t\t\t
\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\"\"\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
\n\t\t\t\t
\n\t\t\t\t\t\t\t\t\t

MTP trunk measured by MMF and BIMMF master jumpers<\/span><\/strong><\/p>\n

Tested product:
\u2022 <\/span>1xMTP(F) \u2013 1xMTP(F) 12F 50\/125\u00b5m BIMMF trunk Pol. B 20.0m
<\/span>\u2022 <\/span>1xMTP(F) \u2013 1xMTP(F) 12F 50\/125\u00b5m BIMMF trunk Pol. B 29.0m
<\/span>\u2022 <\/span>1xMTP(F) \u2013 1xMTP(F) 12F 50\/125\u00b5m BIMMF trunk Pol. B 32.0m<\/span><\/p>\n

Master jumper:
\u2022 <\/span>1xMTP(M) \u2013 1xMTP(M) 12F 50\/125\u00b5m MMF trunk 3.0m
<\/span>\u2022 <\/span>1xMTP(M) \u2013 1xMTP(M) 12F 50\/125\u00b5m BIMMF trunk 3.0m<\/span><\/p>\n

Measurement method:
\u2022 <\/span>Measured according to IEC-61300-3-4 method B<\/span><\/p>\n

Equipment used:
\u2022 <\/span>JGR MS12001 system<\/span><\/p>\n\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

\n\t\t\t\t
\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\"\"\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
\n\t\t\t\t
\n\t\t\t\t\t\t\t\t\t

For this test an MTP connector was chosen as one of the most highly demanded connectors in datacentres. The MTP connector was terminated on 50\/125\u00b5m BIMMF. Two different fibre types were used in the master jumpers that were used for this test. One group of master jumpers contained 50\/125\u00b5m MMF, while the second group contained 50\/125\u00b5m BIMMF. The initial conditions stayed the same for all tests. Almost 200 values were obtained with each master jumper. The best results were obtained by master jumpers with 50\/125\u00b5m MMF, as seen in table 2. Values obtained by BIMMF are 11% higher than the value obtained by MMF. The detailed results are shown in chart 2. The dispersion of results obtained by MMF and BIMMF are comparable to each other. Insertion losses measured by BIMMF master jumpers were higher than the ones obtained by MMF.<\/span><\/p>\n\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

\n\t\t\t\t
\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\"\"\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
\n\t\t\t\t
\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\"\"\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
\n\t\t\t\t
\n\t\t\t\t\t\t\t\t\t

LC\/PC to MTP fanout measured by MMF and BIMMF master jumpers<\/span><\/strong><\/p>\n

Tested product:
\u2022 <\/span>6xLCD\/PC \u2013 1xMTP(F) 12F 50\/125\u00b5m BIMMF direct split 0.34m<\/span><\/p>\n

Master jumper:
\u2022 <\/span>1xMTP(M) \u2013 1xMTP(M) 12F 50\/125\u00b5m BIMMF trunk 3.0m
<\/span>\u2022 <\/span>LC\/PC \u2013 SC\/APC 50\/125\u00b5m MMF simplex jumper 3.0m
<\/span>\u2022 <\/span>LC\/PC \u2013 SC\/APC 50\/125\u00b5m BIMMF simplex jumper 3.0m<\/span><\/p>\n

Measurement method:
\u2022 <\/span>Measured according to IEC 61280-4-1 annex A, one cord reference method<\/span><\/p>\n

Equipment used:
\u2022 <\/span>JGR MS12001 system<\/span><\/p>\n\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

\n\t\t\t\t
\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\"\"\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
\n\t\t\t\t
\n\t\t\t\t\t\t\t\t\t

For this test a combination of LC and MTP connectors was chosen. LC and MTP connectors were terminated on 50\/125\u00b5m BIMMF. Because the channel value was measured in this test, two master jumpers were used during measurement. The first master jumper containing one fibre was referenced before measurement. The second master jumper containing multiple fibres was not referenced. During the measurement, the first master jumper was connected in front of the DUT and the second master jumper was connected after the DUT. Two different fibre types (50\/125\u00b5m MMF and 50\/125\u00b5m BIMMF) were used in single-fibre master jumpers that were used for this test, but only 50\/125\u00b5m BIMMF fibres were used in multi-fibre master jumpers. This was done to change only one condition while switching from 50\/125\u00b5m MMF to 50\/125\u00b5m BIMMF. The initial conditions stayed the same for all tests. This test was performed according to IEC 61280-4-1 annex A, one cord reference method. Around 270 values were measured by each master jumper. On average, the best results were obtained by master jumpers with 50\/125\u00b5m MMF. Values obtained by BIMMF are 118% higher than the value obtained by MMF. More detailed results are shown in chart 3, where it can be seen that there was slightly higher dispersion in insertion loss values obtained by BIMMF. All results obtained by BIMMF are higher than the ones obtained by MMF master jumpers.<\/span><\/p>\n\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

\n\t\t\t\t
\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\"\"\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
\n\t\t\t\t
\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\"\"\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
\n\t\t\t\t
\n\t\t\t\t\t\t\t\t\t

Conclusion<\/span><\/strong><\/p>\n

Although the IEC 61280-4-1 standard allows the use of MMF and BIMMF in master jumpers and their mutual exchange, at first glance it can be seen that they are different fibres. BIMMF have one more extra layer around the core. From the point of view of geometry, this layer has no effect, but according to the results of IL measurement, there is a difference between the measured values obtained with master jumper with MMF and with master jumper with BIMMF. Tests have shown that if the DUT contains BIMMF, the use of the same fibre type in the master jumper will give higher insertion loss than the  master jumper with legacy MMF that has been recommended by the IEC standard in the past. These tests showed that this difference can be up to 0.19dB. Thus, although the new revision of the IEC standard allows the use of MMF or BIMMF in master jumpers, it must be taken into account that these fibres have various properties and behave differently.<\/span><\/p>\n

 <\/span><\/p>\n

Juraj Kadlec \u2013 <\/span>Metrology Engineer<\/span> <\/strong> \u2013 Contact<\/a><\/p>\n

Juraj Kadlec is metrology engineer at Sylex. He started as a project engineer with specialization for multi-fiber MTP technology. He widened his activities to fiber optics sensors. Later, he participated in technology and engineering activities responsible for transferring customer ideas to the final products. Later, he held the role of industrial engineer and was responsible for product documentation. In his current position he is responsible for metrology, measured data analysis, optimizing all instruments used for measuring, their maintenance and service.<\/span><\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

\n\t\t\t\t
\n\t\t\t\t\t\t\t\t\t
\n\t\t\t\t\t\n\t\t\t\t\t\t\n\t\t\t\t\t\t\n\t\t\t\t<\/i>\t\t\t<\/span>\n\t\t\t\t\t\t\t\t\tDownload<\/span>\n\t\t\t\t\t<\/span>\n\t\t\t\t\t<\/a>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t<\/div>\n\t\t","protected":false},"excerpt":{"rendered":"

S rozvojom technol\u00f3gi\u00ed niektor\u00e9 vyn\u00e1lezy nahr\u00e1dzaj\u00fa in\u00e9 a nahraden\u00e9 vyn\u00e1lezy sa st\u00e1vaj\u00fa star\u0161\u00edmi produktmi. To plat\u00ed aj pre optick\u00e9 vl\u00e1kna. V s\u00fa\u010dasnosti \u010doraz viac spolo\u010dnost\u00ed pou\u017e\u00edva BIMMF (ohybovo necitliv\u00e9 multim\u00f3dov\u00e9 vl\u00e1kno) a je \u010doraz \u0165a\u017e\u0161ie k\u00fapi\u0165 be\u017en\u00e9 MMF (multim\u00f3dov\u00e9 vl\u00e1kno), preto\u017ee ide o star\u0161\u00ed produkt. Na tom by nemalo z\u00e1le\u017ea\u0165, ale z\u00e1le\u017e\u00ed.<\/p>\n","protected":false},"author":3,"featured_media":11872,"comment_status":"open","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"footnotes":""},"categories":[543,375],"tags":[537],"class_list":["post-14833","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-blog-sk","category-uncategorized-sk","tag-produkty-a-riesenia"],"acf":[],"yoast_head":"\nMMF alebo BIMMF alias star\u0161ie vl\u00e1kno vs. vl\u00e1kno necitliv\u00e9 na ohyb v hlavn\u00fdch prepojk\u00e1ch - Sylex<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.sylex.sk\/sk\/mmf-alebo-bimmf-alias-starsie-vlakno-vs-vlakno-necitlive-na-ohyb-v-hlavnych-prepojkach\/\" \/>\n<meta property=\"og:locale\" content=\"sk_SK\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"MMF alebo BIMMF alias star\u0161ie vl\u00e1kno vs. vl\u00e1kno necitliv\u00e9 na ohyb v hlavn\u00fdch prepojk\u00e1ch - Sylex\" \/>\n<meta property=\"og:description\" content=\"S rozvojom technol\u00f3gi\u00ed niektor\u00e9 vyn\u00e1lezy nahr\u00e1dzaj\u00fa in\u00e9 a nahraden\u00e9 vyn\u00e1lezy sa st\u00e1vaj\u00fa star\u0161\u00edmi produktmi. To plat\u00ed aj pre optick\u00e9 vl\u00e1kna. V s\u00fa\u010dasnosti \u010doraz viac spolo\u010dnost\u00ed pou\u017e\u00edva BIMMF (ohybovo necitliv\u00e9 multim\u00f3dov\u00e9 vl\u00e1kno) a je \u010doraz \u0165a\u017e\u0161ie k\u00fapi\u0165 be\u017en\u00e9 MMF (multim\u00f3dov\u00e9 vl\u00e1kno), preto\u017ee ide o star\u0161\u00ed produkt. 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